Communication today is not as easy as it was in the past. Protecting numerous com-
munication services, which are operating in the same or adjacent communication
channels, has become increasingly challenging. Communication systems have to be
protected from both natural and manmade interference. Elec ...
This book is intended to help electric power and telephone company
personnel and individuals interested in properly protecting critical tele
communications circuits and equipment located in high voltage (HV)
environments and to improve service reliability while maintaining safe
working conditions. ...
This effort started as an answer to the numerous questions the authors have
repeatedly had to answer about electrostatic discharge (ESD) protection and
input/output (1/0) designs. In the past no comprehensive book existed suffi-
ciently covering these areas, and these topics were rarely taught in en ...
Electrostatic discharge (ESD) is one of the most prevalent threats to the reliability
of electronic components. It is an event in which a finite amount of charge is trans-
ferred from one object (i.e., human body) to another (i.e., microchip). This process
can result in a very high current passing t ...
Failure analysis is invaluable in the learning process of electrostatic discharge (ESD) and
electrical overstress (EOS) protection design and development [1–8]. In the failure analysis
of EOS, ESD, and latchup events, there are a number of unique failure analysis processes
andinformationthatcanprov ...
Dear Reader, this book project brings to you a unique study tool for ESD
protection solutions used in analog-integrated circuit (IC) design. Quick-start
learning is combined with in-depth understanding for the whole spectrum of cross-
disciplinary knowledge required to excel in the ESD field. The ch ...
The goal of this book is to introduce the simulation methods necessary to describe
the behaviour of semiconductor devices during an electrostatic discharge (ESD).
The challenge of this task is the correct description of semiconductor devices under
very high current density and high temperature trans ...
This paper reviews key factors to practical ESD
protection design for RF and analog/mixed-signal (AMS) ICs,
including general challenges emerging, ESD-RFIC interactions,
RF ESD design optimization and prediction, RF ESD design
characterization, ESD-RFIC co-design technique, etc. Practical
design exa ...
