标签：eos - 电子研发网

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eos1b数据广泛用于遥感图像处理

eos1b数据广泛用于遥感图像处理，所以了解eos 1b对于遥感的后期应用十分重要！

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标签： eos1b 数据图像处理遥感

上传时间： 2016-01-01

上传用户：253189838

HDFDUMP and BRFDUMP are utility programs developed for use with MISR data files. HDFDUMP will ext

HDFDUMP and BRFDUMP are utility programs developed for use with MISR data files. HDFDUMP will extract data from a MISR file in the HDF-EOS grid format (MISR Level 1B2 and Level 2 files) and writes unformatted binary files. BRFDUMP calculates radiances and bidirectional reflectance factors (BRF) f ...

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标签： HDFDUMP developed programs BRFDUMP

上传时间： 2017-04-02

上传用户：yy541071797

ESD - Failure Mechanisms and Models

Failure analysis is invaluable in the learning process of electrostatic discharge (ESD) and electrical overstress (EOS) protection design and development [1–8]. In the failure analysis of EOS, ESD, and latchup events, there are a number of unique failure analysis processes andinformationthatcanprov ...

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标签： Mechanisms Failure Models ESD and

上传时间： 2020-06-05

上传用户：shancjb

Basic ESD Design Guidelines

ESD is a crucial factor for integrated circuits and influences their quality and reliability. Today increasingly sensitive processes with deep sub micron structures are developed. The integration of more and more functionality on a single chip and saving of chip area is required. Integrated circuits ...

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标签： Guidelines Design Basic ESD

上传时间： 2020-06-05

上传用户：shancjb

ESD-Phenomena-and-the-Reliability

As we enter the next millennium, there are clear technological patterns. First, the electronic industry continues to scale microelectronic structures to achieve faster devices, new devices, or more per unit area. Secondly, electrostatic charge, electrostatic discharge (ESD), electrical overstress (E ...

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标签： ESD-Phenomena-and-the-Reliability

上传时间： 2020-06-05

上传用户：shancjb

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eos 15条

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eos1b数据广泛用于遥感图像处理

HDFDUMP and BRFDUMP are utility programs developed for use with MISR data files. HDFDUMP will ext

ESD - Failure Mechanisms and Models

Basic ESD Design Guidelines

ESD-Phenomena-and-the-Reliability

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