Construction Strategy of ESD Protection Circuit
Abstract: The principles used to construct ESD protection on circuits and the basic concept
ions of ESD protection design are presented.
Key words:ESD protection/On circuit, ESD design window, ESD current path
1 引言
静电放电(ESD,Electrostatic Discharge)给电子器件环境会带来破坏性的后果。
它是造成集成电路失效的主要原因之一。随着集成电路工艺不断发展,互补金属氧化物半
导体(CMOS,Complementary Metal-Oxide Semiconductor)的特征尺寸不断缩小,
金属氧化物半导体(MOS, Metal-Oxide Semiconductor)的栅氧厚度越来越薄,MOS 管
能承受的电流和电压也越来越小,因此要进一步优化电路的抗ESD 性能,需要从全芯片
ESD 保护结构的设计来进行考虑。
资源简介:Construction Strategy of ESD Protection CircuitAbstract: The principles used to construct ESD protection on circuits and the basic conceptions of ESD protection design are presented.Key words:ESD protection/On circuit, ESD design window, ...
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